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<title lang=en>High resolution microscopy study of niobium-sapphire interfaces modified by ion beam mixing</title>
<creator>Romana, Laurence</creator>
<creator>Fuchs, G.</creator>
<creator>Brunei, M.</creator>
<creator>Massouras, G.</creator>
<creator>Canut, B.</creator>
<creator>Brenier, R.</creator>
<creator>Ramos, S.M.M.</creator>
<creator>Thevenard, P.</creator>
<contributor>Université des Antilles (UA)</contributor>
<contributor>Groupe de Technologie des Surfaces et Interfaces (GTSI) ; Université des Antilles et de la Guyane (UAG) - Université des Antilles (Pôle Guadeloupe) ; Université des Antilles (UA) - Université des Antilles (UA)</contributor>
<contributor>Institut des Nanotechnologies de Lyon - Site de l'INSA (INL) ; École Centrale de Lyon (ECL) - Université Claude Bernard Lyon 1 (UCBL) - Institut National des Sciences Appliquées de Lyon (INSA Lyon) - Centre National de la Recherche Scientifique (CNRS)</contributor>
<contributor>Laboratoire de Physique de la Matière Condensée et Nanostructures (LPMCN) ; Université Claude Bernard Lyon 1 (UCBL) - Centre National de la Recherche Scientifique (CNRS)</contributor>
<description>International audience</description>
<source>ISSN: 0168-583X</source>
<source>Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms</source>
<publisher>Elsevier</publisher>
<identifier>hal-01685819</identifier>
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<source>Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 1991, 59-60, pp.567 - 571. 〈10.1016/0168-583X(91)95281-H〉</source>
<identifier>DOI : 10.1016/0168-583X(91)95281-H</identifier>
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<subject>[PHYS] Physics [physics]</subject>
<subject>[SPI] Engineering Sciences [physics]</subject>
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<type>Journal articles</type>
<date>1991-07</date>
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